Jerzy Krupka

Jerzy Krupka is employed as a professor at the Institute of Microelectronics and Optoelectronics, Warsaw University of Technology. His research mainly deals with measurements of the electric and magnetic properties of materials at microwave frequencies and computational electrodynamics. He was a leader and took part in several research projects on these subjects in U.S.A., United Kingdom, Australia, Germany, Taiwan, China, France and Singapore. He published more than 300 papers in world renowned journals and the number of citations of his research is more than 9000 (Google Scholar). In 2012 he was elevated to the grade of IEEE Fellow for the contributions to high frequency measurements of electromagnetic properties of materials. He is listed among World’s TOP 2% Scientist – based on Stanford and Elsevier data.

Title of the presentation:
Measurement and Characterization Techniques of Dielectric, Magneto-Dielectric, Conducting and Superconducting Materials at Microwave Frequencies

Abstract:

Accurate characterization of materials at microwave frequencies remains one of the key challenges and enablers of progress in modern microwave engineering, materials science, and device design. Understanding the dielectric, magnetic, and conductive properties of advanced materials is essential for innovations in high-frequency electronics, sensing, and wireless communication systems.
Recent advances in microwave measurement techniques have enabled precise characterization of a broad range of materials, including low-loss dielectrics, magneto-dielectrics, semiconductors, conductors, and superconductors. Modern experimental methods, combined with electromagnetic modeling and parameter extraction procedures, provide reliable determination of material properties for both bulk and thin-film samples.
Particular attention is given to measurements of complex permittivity in dielectric and anisotropic materials, contactless microwave characterization of semiconducting and conducting media, and determination of magnetic and dielectric properties of ferromagnetic and ferrimagnetic materials relevant to microwave and spintronic applications.
These developments demonstrate how precision microwave metrology supports the design of advanced materials and enables next-generation microwave components, devices, and communication systems.