Accurate characterization of materials at microwave frequencies remains one of the key challenges and enablers of progress in modern microwave engineering, materials science, and device design. Understanding the dielectric, magnetic, and conductive properties of advanced materials underpins innovations in high-frequency electronics and wireless communication systems.

This focused session will bring together experts working on the development and application of microwave measurement techniques for a wide range of materials – from low-loss dielectrics and magneto-dielectrics to semiconductors, conductors, and superconductors. The session will provide a platform for sharing new experimental methods, modeling approaches, and results related to both bulk and thin-film samples.

Topics of interest include, but are not limited to:

• Measurements of the complex permittivity of dielectric and anisotropic materials.
• Contactless microwave measurements of semiconducting, conducting, and superconducting materials.
• Characterization of magnetic and dielectric properties of ferromagnetic and ferrimagnetic materials for microwave and spintronic applications.

This session aims to foster exchange between researchers working at the intersection of material science and microwave engineering, and to highlight the latest advancements in precision measurement techniques that drive next-generation technologies.